Interference fringes in multiple Bragg-Laue mode.

Interference fringes in multiple Bragg-Laue mode.
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多重布拉格-劳厄模式下的干涉条纹。

DOI:
10.1107/s0108767310051573
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发表时间:
2011
期刊:
Acta crystallographica. Section A, Foundations of crystallography
影响因子:
--
通讯作者:
T. Kawamura
T. Kawamura
中科院分区:
--
文献类型:
--
作者:
T. Fukamachi;K. Hirano;R. Negishi;Y. Kanematsu;Sukswat Jongsukswat;K. Hirano;T. Kawamura

文献摘要

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通过改变x射线入射点与两种不同厚度H的样品晶体的距离L,在Si平面平行晶体的侧面测量了多重Bragg-Laue模式下的干涉条纹,当距离L变大或厚度H变小时,干涉条纹的周期变大。当L/H大于15时,除了干涉条纹外,还会出现较短的振荡周期。在衍射动力学理论的基础上,通过考虑多布拉格-劳模式的光束来解释这些变化。当L/H小于15时,通过考虑光束在Bragg-Laue模式和Bragg-Bragg-Laue模式下的干涉,可以很好地再现实测条纹。通过在高阶布拉格-劳模式下增加光束的强度,可以再现L/H bbb15观测到的短周期振荡。考虑能见度计算得到的干涉条纹与实测条纹吻合较好。
Interference fringes in multiple Bragg-Laue mode have been measured from the lateral surface of an Si plane-parallel crystal by changing the distance L between the incident point of X-rays and the crystal edge for two sample crystals with different thicknesses H. The period of the interference fringes becomes large when the distance L becomes large or the thickness H becomes small. When the ratio L/H is larger than 15, a shorter period of oscillation appears in addition to the interference fringes. These variations are explained by considering the beams in multiple Bragg-Laue modes based on the dynamical theory of diffraction. When L/H is less than 15, the measured fringes are well reproduced by taking account of interference between beams in the Bragg-Laue and the Bragg-Bragg-Laue modes. The short period of the oscillations observed for L/H > 15 is reproduced by adding the intensities of the beams in higher-order Bragg-Laue mode. The interference fringes calculated by taking the visibility into account show good agreement with the measured ones.