Interference Electron Microscopy by Means of Holography
Interference Electron Microscopy by Means of Holography
复制标题
利用全息术的干涉电子显微镜
DOI：
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发表时间：
1979
期刊：
影响因子：
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通讯作者：
A. Tonomura
中科院分区：
文献类型：
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作者：
J. Endo;T. Matsuda;A. Tonomura
利用相位差放大技术，将电子全息术应用于干涉显微镜。用场发射电子显微镜形成像电子全息图。在光学再现阶段，将两束激光照射到全息图上，得到位相放大干涉图和等高线图。该方法被有效地应用于电子显微镜样品，如多面体细颗粒，其相变有时不足以进行干涉显微镜观察。
Electron holography was applied to interference microscopy by means of the phase-difference amplification technique. Image electron holograms were formed with a field emission electron microscope. Phase-amplified interferograms and contour maps were obtained by the illumination of two laser beams onto the holograms, at the optical reconstruction stage. The method was effectively applied to electron microscopic specimens such as polyhedral fine particles whose phase changes sometimes had not been large enough for interference microscopy.