Single-shot carrier-envelope phase measurement of few-cycle laser pulses
Single-shot carrier-envelope phase measurement of few-cycle laser pulses
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DOI：
10.1038/nphys1250
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发表时间：
2009-05-01
期刊：
影响因子：
19.6
通讯作者：
Kienberger, R.
中科院分区：
文献类型：
--
作者：
Wittmann, T.;Horvath, B.;Kienberger, R.
阿秒计量和光谱学需要对单个超短激光脉冲进行全面表征，需要精确测量电场与脉冲包络或载波包络相位（CEP）之间的偏移量。到目前为止，所有的CEP测量都是通过对大量相位稳定的激光脉冲进行平均来完成的。在这里，我们展示了第一次单次CEP测量强烈的少周期激光脉冲。我们将激光脉冲聚焦在气体目标上，并检测平行于激光偏振方向的相反方向（“左-右”）发射的光电子。通过比较不同能量下光电子的左右不对称性，我们在参数图上绘制了连续非相位稳定脉冲的CEP。这种新的评估方法使我们能够以前所未有的测量精度确定无相位模糊的CEP。与目前的稳相激光器相比，用CEP标记在更低的相位抖动下进行相位依赖现象的未来研究现在是可能的。
Full characterization of single ultrashort laser pulses, as needed for attosecond metrology and spectroscopy, requires precise measurement of the offset between the electric field and pulse envelope, or carrier-envelope phase (CEP). Until now, all CEP measurements have been made by averaging over a large number of phase-stabilized laser pulses. Here, we demonstrate the first single-shot CEP measurement of intense few-cycle laser pulses. We focus a laser pulse on a gas target and detect photoelectrons emitted in opposing directions ('left-right') parallel to the polarization of the laser. By comparing the left-right asymmetries of photoelectrons at different energies, we mapped the CEP of consecutive non-phase-stabilized pulses on a parametric plot. This new evaluation method enables us to determine the CEP without phase ambiguity at unprecedented measurement precision. Future investigation of phase-dependent phenomena with CEP tagging at a much lower phase jitter than accessible at present with phase-stabilized lasers is now possible.