Near-infrared imaging of developmental defects in dental enamel
Near-infrared imaging of developmental defects in dental enamel
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DOI：
10.1117/1.2956374
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发表时间：
2008-07-01
影响因子：
3.5
通讯作者：
Darling, Cynthia L.
中科院分区：
文献类型：
--
作者：
Hirasuna, Krista;Fried, Daniel;Darling, Cynthia L.
偏振敏感光学相干层析成像（PS-OCT）和近红外成像（NIR）是早期监测龋齿病变的有前途的新技术。氟中毒在美国是一个日益严重的问题，更普遍的轻度氟中毒在视觉上可能被误认为是早期的牙釉质脱矿。不幸的是，目前关于健全牙釉质、牙釉质发育缺陷和龋齿的光学特性差异的定量信息很少。用PS-OCT和近红外对30颗不同程度怀疑氟中毒的拔牙进行了成像。采用InGaAs相机和近红外二极管激光器测量齿横截面（约200 μ m）的光衰减。采用数字显微放射照相系统通过测量相对矿物质损失来量化牙釉质缺陷的严重程度，并与光学散射测量结果进行比较。发育缺陷在偏振分辨OCT图像中清晰可见，表明PS-OCT可用于无损测量缺陷的深度和可能的严重程度。全牙牙釉质缺损在近红外下是透明的，可以在可见光下进行高对比度成像。本研究提示PS-OCT和NIR方法有可能作为评估牙釉质缺损严重程度的工具。(C) 2008光学仪器工程师学会。
Polarization-sensitive optical coherence tomography (PS-OCT) and near-infrared (NIR) imaging are promising new technologies under development for monitoring early carious lesions. Fluorosis is a growing problem in the United States, and the more prevalent mild fluorosis can be visually mistaken for early enamel demineralization. Unfortunately, there is little quantitative information available regarding the differences in optical properties of sound enamel, enamel developmental defects, and caries. Thirty extracted human teeth with various degrees of suspected fluorosis were imaged using PS-OCT and NIR. An InGaAs camera and a NIR diode laser were used to measure the optical attenuation through transverse tooth sections (similar to 200 mu m). A digital microradiography system was used to quantify the enamel defect severity by measurement of the relative mineral loss for comparison with optical scattering measurements. Developmental defects were clearly visible in the polarization-resolved OCT images, demonstrating that PS-OCT can be used to nondestructively measure the depth and possible severity of the defects. Enamel defects on whole teeth that could be imaged with high contrast with visible light were transparent in the NIR. This study suggests that PS-OCT and NIR methods may potentially be used as tools to assess the severity and extent of enamel defects. (C) 2008 Society of Photo-Optical Instrumentation Engineers.