Experimental research on the feature of an x-ray Talbot–Lau interferometer versus tube accelerating voltage
Experimental research on the feature of an x-ray Talbot–Lau interferometer versus tube accelerating voltage
复制标题
X射线Talbot-Lau干涉仪特性随管加速电压的实验研究
DOI：
10.1088/1674-1056/24/6/068703
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发表时间：
2015
影响因子：
1.7
通讯作者：
吴自玉
中科院分区：
文献类型：
--
作者：
高昆;张凯;朱佩平;吴自玉
x射线塔尔博特-劳干涉仪已被广泛应用于传统的低亮度x射线源进行x射线相衬成像，它产生高灵敏度的相和样品的暗场图像产生低吸收对比度，因此
X-ray Talbot–Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thu