In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector.

In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector.
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DOI:
10.1107/s1600577513034759
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发表时间:
2014-03
影响因子:
2.5
通讯作者:
van Silfhout R
van Silfhout R
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Kachatkou A;Marchal J;van Silfhout R

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本文报道了微聚焦x射线束的位置和尺寸测量,使用基于无透镜相机的x射线束成像设备,该设备收集以斜角放置在光束路径上的薄片散射的辐射。本文报道了用无透镜照相机记录低z材料薄片散射辐射的思想,利用x射线束成像(XBI)仪器进行微聚焦x射线束诊断的研究结果。XBI仪器在入射光束照射下捕获箔片内散射区域的放大图像。这些图像包含在专用信号处理步骤中提取的有关波束大小、波束位置和波束强度的信息。在这项工作中,探索了光束尺寸明显小于单个探测器像素的光束装置的使用。分析了配备最先进的混合像素x射线成像传感器的XBI设备的性能。与传统方法(如狭缝或线扫描)相比,XBI微聚焦光束表征明显更快,并且不会干扰正在进行的实验。描述了测量微米级光束所面临的挑战,并讨论了优化XBI仪器的光束位置和尺寸测量分辨率的方法。
Position and size measurements of a micro-focused X-ray beam, using an X-ray beam imaging device based on a lensless camera that collects radiation scattered from a thin foil placed in the path of the beam at an oblique angle, are reported. Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region within the foil as illuminated by the incident beam. These images contain information about beam size, beam position and beam intensity that is extracted during dedicated signal processing steps. In this work the use of the device with beams for which the beam size is significantly smaller than that of a single detector pixel is explored. The performance of the XBI device equipped with a state-of-the-art hybrid pixel X-ray imaging sensor is analysed. Compared with traditional methods such as slit edge or wire scanners, the XBI micro-focused beam characterization is significantly faster and does not interfere with on-going experiments. The challenges associated with measuring micrometre-sized beams are described and ways of optimizing the resolution of beam position and size measurements of the XBI instrument are discussed.