Kramers-Kronig constrained modeling of soft x-ray reflectivity spectra: Obtaining depth resolution of electronic and chemical structure
Kramers-Kronig constrained modeling of soft x-ray reflectivity spectra: Obtaining depth resolution of electronic and chemical structure
复制标题
软 X 射线反射率光谱的 Kramers-Kronig 约束建模：获得电子和化学结构的深度分辨率
DOI：
--
复制
发表时间：
2012
期刊：
影响因子：
--
通讯作者：
J. Kortright
中科院分区：
文献类型：
--
作者：
K. Stone;S. M. Valvidares;J. Kortright
软X射线反射率谱的Kramers-Kronig约束建模-获得电子和化学结构的深度分辨率。斯通和杰奎琳B。材料科学部，劳伦斯伯克利国家实验室，伯克利，CA 94720 S。Manuel Valvidares ALBA同步加速器光源，082980 Cerdonyola del Vall`es，巴塞罗那，西班牙（日期：2012年4月27日）摘要共振x射线散射是一种强大的技术，用于确定纳米级的电子结构。在通常的实践中，在对散射强度建模之前，必须知道材料的组成成分的光学性质。我们提出了一种改进电子结构的方法，以Kramers-Kronig一致的方式，以光学性质的形式，与物理结构同步。这种方法构成了一个敏感的和强大的扩展共振X射线散射的材料的光学性质是不succiently众所周知的。作为一个例子，我们发现了非共振表面污染层和改性艾德SrTiO 3表面区域的证据。外推从这项研究中，我们评论这种方法的潜在效用共振散射研究一般。
Kramers-Kronig Constrained Modeling of Soft X-ray Reflectivity Spectra - Obtaining Depth Resolution of Electronic and Chemical Structure Kevin H. Stone ∗ and Jeffrey B. Kortright † Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA 94720 S. Manuel Valvidares ALBA Synchrotron Light Source, 082980 Cerdonyola del Vall`es, Barcelona, Spain (Dated: April 27, 2012) Abstract Resonant x-ray scattering is a powerful technique for the determination of electronic structure at the nanoscale. In common practice, the optical properties of the constituent components of a material must be known prior to modeling of the scattered intensity. We present a means of refining electronic structure, in the form of optical properties, simultaneous to physical structure, in a Kramers-Kronig consistent manner. This approach constitutes a sensitive and powerful extension of resonant x-ray scattering to materials where the optical properties are not sufficiently well known. The application of this approach to specular reflectivity from a single crystal of SrTiO 3 is presented as an example case, wherein we find evidence for both a non-resonant surface contaminant layer and a modified SrTiO 3 surface region. Extrapolating from this study we comment on the potential utility of this approach to resonant scattering studies in general.
影响因子：
41.2
作者：
Meevasana, W.;King, P. D. C.;Shen, Z-X.
通讯作者：
Shen, Z-X.