Vertical seismic profiling migration using the Kirchhoff integral
Vertical seismic profiling migration using the Kirchhoff integral
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DOI：
10.1190/1.1442514
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发表时间：
1988-06
期刊：
影响因子：
3.3
通讯作者：
P. Dillon
中科院分区：
文献类型：
--
作者：
P. Dillon
波动方程偏移可以从合适的VSP数据中形成准确的地下图像。图像的范围和分辨率由接收器阵列的维度和震源位置决定(S)。合成数据和真实数据的实验表明，可靠的图像范围由镜面反射的“照明区”来定义。偏移是通过波场外推实现的，但要经过成像程序。波场外推基于标量波动方程，对于VSP资料，可以方便地用Kirchhoff积分进行处理。VSP资料的偏移既需要在井眼附近成像，也需要在远场成像。这种双重要求是通过保留积分的近场项来满足的。完整的积分解决方案很容易被各种加权装置和处理策略控制，其价值在真实和合成数据上得到了证明。
Wave‐equation migration can form an accurate image of the subsurface from suitable VSP data. The image’s extent and resolution are determined by the receiver array dimensions and the source location(s). Experiments with synthetic and real data show that the region of reliable image extent is defined by the specular “zone of illumination.” Migration is achieved through wave‐field extrapolation, subject to an imaging procedure. Wave‐field extrapolation is based upon the scalar wave equation and, for VSP data, is conveniently handled by the Kirchhoff integral. The migration of VSP data calls for imaging very close to the borehole, as well as imaging in the far field. This dual requirement is met by retaining the near‐field term of the integral. The complete integral solution is readily controlled by various weighting devices and processing strategies, whose worth is demonstrated on real and synthetic data.