Surface roughness effects on the terahertz reflectance of pure explosive materials
Surface roughness effects on the terahertz reflectance of pure explosive materials
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DOI：
10.1063/1.2973403
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发表时间：
2008-08-25
影响因子：
4
通讯作者：
Huebers, H. -W.
中科院分区：
文献类型：
--
作者：
Ortolani, M.;Lee, J. S.;Huebers, H. -W.
利用傅里叶变换光谱技术研究了炸药表面粗糙度对炸药在准正入射和斜入射下的太赫兹反射光谱的影响。从纯的光学平坦颗粒的反射光谱中测定了1，3，5，7-四硝基-1，3，5，7-四氮杂环辛烷和1，3，5-三硝基-1，3，5-三氮杂环己烷的光学常数，在0.5-8 THz范围内发现了清晰的光谱特征。在几十微米的实际表面粗糙度的情况下，在准正入射下的光谱特征的观察受到太赫兹频率下的镜面反射滚降的阻碍。在增加的入射角，滚降发生在更高的频率和表面粗糙度进行光学测量。斜入射的几何结构有利于太赫兹间隔探测器件的发展。c 2008年美国物理学会。
We studied the effect of surface roughness on terahertz reflectance spectra of explosives at both quasinormal and oblique incidence by Fourier-transform spectroscopy. The optical constants of 1,3,5,7-tetranitro-1,3,5,7-tetrazacyclooctane and 1,3,5 trinitro-1,3,5 triazacyclohexane were determined from the reflectance spectra of pure optically flat pellets and clear spectral signatures were found in the 0.5-8 THz range. In the case of a realistic surface roughness of several tens of microns, the observation of the spectral signatures at quasinormal incidence is hindered by the specular reflectance roll-off at terahertz frequencies. On increasing the angle of incidence, the roll-off occurred at higher frequency and the surface roughness was optically measured. Oblique incidence geometries can benefit the development of terahertz standoff detection devices. c 2008 American Institute of Physics.