A Space-Mapping-Based Optimal EM Design of RCS Reduction for Electrically Large Targets
A Space-Mapping-Based Optimal EM Design of RCS Reduction for Electrically Large Targets
复制标题
基于空间映射的电大目标RCS缩减优化电磁设计
DOI:
10.1109/tap.2021.3069560
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发表时间:
2021-10
影响因子:
5.7
通讯作者:
Chen Rushan
中科院分区:
文献类型:
--
作者:
He Zi;Li Yusheng;Gu Pengfei;Leung Kwok Wa;Chen Rushan
An efficient electromagnetic (EM) optimization technique for radar cross section (RCS) reduction is proposed to achieve stealth. At first, two optimization models, namely coarse and fine models, are constructed to describe the scattering problem. More specifically, the coarse model of shooting and bouncing ray (SBR) method provides worse accuracy results than the fine model of the method of moment (MoM). However, less computational resources are needed for the coarse model when compared with the fine model. Then the SBR method is implemented into the Hummingbird optimization algorithm to obtain the solution of the coarse model. Third, the solution of the coarse model is verified for the fine model by using the MoM. Noted that the impedance boundary condition is applied to accelerate the calculation. At last, the trust region aggressive space-mapping (TRASM) algorithm is used to find the optimal solution between the SBR and MoM methods. By building the mapping relationship between these two models, the optimization efficiency can be significantly improved with high accuracy. Numerical results are given to demonstrate that the proposed optimization technique can be used as a fast tool for the cloaking design of RCS reduction. It is found that the RCS can be reduced largely by using the proposed optimization technique.
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影响因子:
6.7
作者:
Shiquan He;Z. Nie;Jun Hu
通讯作者:
Shiquan He;Z. Nie;Jun Hu
影响因子:
1.5
作者:
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DOI:
10.1109/tmtt.2006.890524
发表时间:
2007-03
影响因子:
4.3
作者:
S. Koziel;J. Bandler
通讯作者:
S. Koziel;J. Bandler
影响因子:
5.7
作者:
Su, Jianxun;Lu, Yao;Song, Jiming
通讯作者:
Song, Jiming
DOI:
10.1002/mmce.20768
发表时间:
2014-05
期刊:
International Journal of RF and Microwave Computer‐Aided Engineering
影响因子:
--
作者:
Juan Xu;Zhaolong Li;Rushan Chen
通讯作者:
Juan Xu;Zhaolong Li;Rushan Chen