The Influence of Acceptor Doping on the Structure and Electrical Properties of Sol-Gel Derived BiFeO3 Thin Films
The Influence of Acceptor Doping on the Structure and Electrical Properties of Sol-Gel Derived BiFeO3 Thin Films
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DOI：
10.1080/00150190701527597
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发表时间：
2007-09
期刊：
影响因子：
0.8
通讯作者：
K. Brinkman;T. Iijima;K. Nishida;T. Katoda;H. Funakubo
中科院分区：
文献类型：
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作者：
K. Brinkman;T. Iijima;K. Nishida;T. Katoda;H. Funakubo
使用溶胶-凝胶工艺在 Pt/TiO 2 /SiO 2 /Si 基板上通过在 700°C 空气中快速热退火制备了掺杂锶的铁酸铋 (BFO) 薄膜，其标称成分为 Bi 1−x Sr x Fe 1 O 3 (x = 0–0.15)。观察到随着 Sr 浓度从 0% 增加到 15%，晶粒尺寸减小（从 1 μm 到 90 nm），同时柱状晶粒生长退化。 X 射线衍射和拉曼散射表明，随着 Sr 浓度的增加，结构从菱面体转变为赝立方体。泄漏测量表明，与纯 BFO 相比，带有 Sr 受主掺杂的薄膜表现出泄漏增加，但由于微观结构的改变，薄膜泄漏并未随着受主浓度的增加而增加。
Bismuth Ferrite (BFO) films doped with strontium resulting in a nominal composition of Bi 1−x Sr x Fe 1 O 3 (x = 0–0.15) were fabricated using a sol-gel process on Pt/TiO 2 /SiO 2 /Si substrates by rapid thermal annealed in air at 700°C. A decrease in the grain size (from 1 μm to 90 nm) with increasing Sr concentration from 0 to 15% was observed, coupled with the degradation of columnar grain growth. X-ray diffraction and raman scattering showed evidence of a structural change from rhombohedral to pseudocubic with increasing Sr concentration. Leakage measurements revealed that films with Sr acceptor doping showed increased leakage compared to pure BFO, however the film leakage did not increase with increasing acceptor concentration due to microstructural modifications.