Temperature dependence of the electrical resistivity and absolute thermoelectric power of amorphous metallic glass Ni 33.3 Zr 66.7
Temperature dependence of the electrical resistivity and absolute thermoelectric power of amorphous metallic glass Ni 33.3 Zr 66.7
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DOI：
10.1016/j.jnoncrysol.2017.11.012
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发表时间：
2018-02
影响因子：
3.5
通讯作者：
B. Smili;A. Messaoud;W. Bouchelaghem;L. Abadlia;N. Fazel;A. Benmoussa;I. Kaban;F. Gasser;J. Gasser
中科院分区：
文献类型：
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作者：
B. Smili;A. Messaoud;W. Bouchelaghem;L. Abadlia;N. Fazel;A. Benmoussa;I. Kaban;F. Gasser;J. Gasser
利用自制的电阻率和绝对热电势（ATP）同时测量装置，利用LabView软件对Ni 33.3Zr 66.7金属玻璃（MG）的电子输运性质和热稳定性进行了研究。电阻率和绝对热电功率在25至400 °C的温度范围内以0.5 K min− 1的标称加热速率同时非常精确地测量。在相同的温度范围内的电子热导率也确定使用Wiedemann-Franz定律。由于其高效率，这种技术是越来越多地使用，因为它的特点是由一个高灵敏度检测的相变相关的电子输运，这是本研究的目的。通过对Ni33.3Zr66.7非晶薄带电阻率和ATP随温度变化的分析，证明了这种表征方法在研究金属玻璃热行为方面的潜力。采用X射线衍射（XRD）和扫描电子显微镜（SEM）研究了Ni33.3Zr66.7非晶合金在淬火态和热处理后的晶体结构和形貌。
Electron transport properties and thermal stability of Ni33.3Zr66.7metallic glass (MG) have been studied using an original device for simultaneous measurements of electrical resistivity and absolute thermoelectric power (ATP) controlled by a LabView software written by one of us. The electrical resistivity and absolute thermoelectric power were measured simultaneously and very accurately over a temperature range from 25 to 400 °C with a nominal heating rate of 0.5 K min− 1. The electronic thermal conductivity was also determined using the Wiedemann–Franz law in the same temperature range. Due to its high efficiency, this technique is more and more used because it is characterized by a high sensitivity to detection of the phase transitions related to electronic transport, which is the aim of this study. Analysis of the temperature dependence of the resistivity and ATP of the Ni33.3Zr66.7glassy ribbons proves the potential of this characterization method to study the thermal behavior of metallic glasses. The crystal structure and the morphology of Ni33.3Zr66.7metallic glass in the as-quenched state and after heat treatments were studied using X-ray diffraction (XRD), and scanning electron microscope (SEM).