In‐plane alignment of a‐axis oriented YBa2Cu3Ox thin films
In‐plane alignment of a‐axis oriented YBa2Cu3Ox thin films
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a轴取向YBa2Cu3Ox薄膜的面内排列
DOI：
10.1063/1.109819
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发表时间：
1993
影响因子：
4
通讯作者：
S. Miyazawa
中科院分区：
文献类型：
--
作者：
M. Mukaida;S. Miyazawa
用φ-Scan X射线衍射仪、反射式高能电子衍射仪和平面电子显微镜研究了a轴取向的YBa2Cu3Ox薄膜在SrLaGaO4(100)衬底上的平面取向。结果表明，薄膜具有双重对称性，在表面平面上显示出独立的b轴和c轴取向。在SrLaGaO4(100)衬底上a轴取向的YBa2Cu3Ox薄膜没有90°磁畴，其c轴方向与衬底方位角的[001]方向一致。290K时c轴方向的电阻率为5.5mΩ cm，约为a轴方向的11倍。C轴方向的归一化电阻率温差d[R(T)/R(300)]/dt(1.1×10−3K−1)小于b轴方向的d[R(T)/R(30 0)]/dt(2.8×10−3K−1)。
The in‐plane orientation of a‐axis oriented YBa2Cu3Ox thin films on SrLaGaO4 (100) substrates is studied by φ‐scan (in‐plane rotation) x‐ray diffraction, reflection high energy electron diffraction, and planar‐view transmission electron microscopy measurements. It is revealed that the thin films exhibit a twofold symmetry, indicating independent b‐ and c‐axis orientations in the surface plane. There are no 90° domains, and the c‐axis of a‐axis oriented YBa2Cu3Ox thin films on SrLaGaO4 (100) is aligned to the [001] direction of the substrate azimuth. The resistivity in the c‐axis direction at 290 K is 5.5 mΩ cm, about eleven times larger than that in the a‐axis direction. The temperature differential of normalized resistivity, d[R(T)/R(300)]/dT, in the c‐axis direction (1.1×10−3 K−1) is smaller than that in the b‐axis direction (2.8×10−3 K−1).