Optimal release problem and reproblem and reroblem and reroblem and reliability analysis for the OSS porting phase of embedded system development

Optimal release problem and reproblem and reroblem and reroblem and reliability analysis for the OSS porting phase of embedded system development
复制标题

嵌入式系统开发OSS移植阶段的优化发布问题、重新问题、重新问题、可靠性分析

DOI：
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发表时间：
2010
期刊：
Proceedings of the 16th ISSAT International Conference on Reliability and Quality in Design(Wasington, D.C., USA)
影响因子：
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通讯作者：
S.Yamada
S.Yamada
中科院分区：
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文献类型：
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作者：
H.Kato;Y.Tamura;S.Yamada

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