Investigation of resistive switching memory effect in a-TaOx films with atomically flat surface
Investigation of resistive switching memory effect in a-TaOx films with atomically flat surface
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原子级平坦表面 a-TaOx 薄膜中阻变记忆效应的研究
DOI:
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发表时间:
2016
期刊:
影响因子:
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通讯作者:
Y. Takahashi
中科院分区:
文献类型:
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作者:
A. Tsurumaki-Fukuchi;M. Arita;T. Katase;H. Ohta;Y. Takahashi