Effective object planes for aberration-corrected transmission electron microscopy.
Effective object planes for aberration-corrected transmission electron microscopy.
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DOI:
10.1016/j.ultramic.2011.10.006
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发表时间:
2012
期刊:
影响因子:
2.2
通讯作者:
R. Yu;M. Lentzen;J. Zhu
中科院分区:
文献类型:
--
作者:
R. Yu;M. Lentzen;J. Zhu