High-temperature single-crystal 3C-SiC capacitive pressure sensor
High-temperature single-crystal 3C-SiC capacitive pressure sensor
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DOI:
10.1109/jsen.2004.830301
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发表时间:
2004-08-01
影响因子:
4.3
通讯作者:
Ko, WH
中科院分区:
文献类型:
--
作者:
Young, DJ;Du, JG;Ko, WH
Single-crystal 3C-silicon carbide (SiC) capacitive pressure sensors are proposed for high-temperature sensing applications. The prototype device consists of an edge-clamped circular 3C-SiC diaphragm with a radius of 400 mum and a thickness of 0.5 mum suspended over a 2-mum sealed cavity on a silicon substrate. The 3C-SiC film is grown epitaxially on a 100-mm diameter silicon substrate by atmospheric pressure chemical vapor deposition. The fabricated sensor demonstrates a high-temperature sensing capability up to 400 degreesC, limited by the, test setup. At 400 degreesC, the device achieves a linear characteristic response between 1100 and 1760 torr with a sensitivity. of 7.7 fF/torr, a linearity of 2.1%, and a hysterisis of 3.7% with a sensing repeatability of 39 torr (52 mbar). A wide range of sensor specifications, such as linear ranges, sensitivities, and capacitance values, can be achieved by choosing the proper device geometrical parameters.