Atom-Probe Field Ion Microscopy and Its Applications
Atom-Probe Field Ion Microscopy and Its Applications
复制标题
原子探针场离子显微镜及其应用
DOI：
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发表时间：
1989
期刊：
影响因子：
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通讯作者：
T. Sakurai
中科院分区：
文献类型：
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作者：
T. Sakurai
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