Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
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DOI：
10.1103/physrevb.90.045410
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发表时间：
2014-07
影响因子：
3.7
通讯作者：
C. Frank;J. Novák;R. Banerjee;A. Gerlach;F. Schreiber;A. Vorobiev;S. Kowarik
中科院分区：
文献类型：
--
作者：
C. Frank;J. Novák;R. Banerjee;A. Gerlach;F. Schreiber;A. Vorobiev;S. Kowarik
我们报告了一个组合的非镜面和镜面X射线散射生长研究的原型有机半导体didenoperylene（DIP，C32H16）的薄膜。我们研究了薄膜的面内相关长度和生长动力学的演变，包括它们对衬底温度和生长速率的依赖性。我们观察到的DIP分子的温度依赖性的集体重排从一个瞬态表面诱导的薄膜相，这可以合理化，通过将厚度依赖的面外晶格参数。我们进一步观察到，DIP的成核行为的变化，从第一个到第二个单层，我们涉及到的分子的扩散长度的差异。
We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules.