Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions
复制标题
用于预测电磁辐射的微控制器电气模型
DOI：
10.1109/tvlsi.2010.2047281
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发表时间：
2011
影响因子：
2.8
通讯作者：
F. Fiori
中科院分区：
文献类型：
--
作者：
Y. Villavicencio;F. Musolino;F. Fiori
这项工作提出了一种新的方法来推导寄生路径的等效电路，寄生路径在混合信号集成电路中传播开关噪声，通常会导致意外的串扰和电磁发射问题。该方法基于在单个模拟和数字微控制器构建块级别执行的小信号分析，在芯片和封装级别进行的电磁模拟以描述供电网络，以及对芯片布局和工艺技术数据的分析以模拟通过半导体衬底的寄生耦合路径。根据这种方法生成的微控制器的电模型由一个低复杂性和线性网络表组成，通过在类似spice的环境中进行模拟，可以了解设计参数与早期设计阶段噪声传播路径之间的关系。提出的方法不依赖于实验测试结果。本文推导了8位微控制器的电模型，并通过散射参数和传导发射测量证明了该模型的有效性。
This work presents a new methodology to derive the equivalent circuit of the parasitic paths that propagate switching noise in mixed-signals integrated circuits and that usually lead to unintended crosstalk and electromagnetic emission issues. The methodology is based on small-signal analyses performed at the individual analog and digital microcontroller building block level, on electromagnetic simulations carried out to describe the power supply network at the chip- and at the package-level and on the analysis of the chip layout and process technology data to model the parasitic coupling paths through the semiconductor substrate. The electrical model of microcontrollers generated according to this methodology, consists of a low-complex and linear netlist that provides insight regarding the relationships between the design parameters and noise propagation paths in the early design phases, through simulations in a SPICE-like environment. The proposed approach does not rely on experimental test results. In this paper, the electric model of an 8 bit microcontroller, which validity has been proved by scattering parameter and conducted emission measurements, is derived.