Fabrication of superconductor-ferromagnet-insulator-superconductor Josephson junctions with critical current uniformity applicable to integrated circuits
Fabrication of superconductor-ferromagnet-insulator-superconductor Josephson junctions with critical current uniformity applicable to integrated circuits
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DOI：
10.7567/apex.10.033101
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发表时间：
2017-03-01
影响因子：
2.3
通讯作者：
Fujimaki, Akira
中科院分区：
文献类型：
--
作者：
Ito, Hiroshi;Taniguchi, Soya;Fujimaki, Akira
采用Pd_（89）Ni_（11）铁磁夹层和AlOx隧道势垒层制备了用于大规模超导集成电路的Nb约瑟夫森结。结有一个小的临界电流（I-C）的蔓延，其中标准偏差1 σ小于2%，在4.2K的结具有相同的设计尺寸。据观察，可以通过操纵PdNi中间层的膜厚度来控制结的电学行为。对于9和11 nm的厚度，结表现为pi-JJ，对于9 nm，在1.2%的I-c扩展中显示1 σ。(C)2017日本应用物理学会。
Nb Josephson junctions (JJs) were fabricated with a Pd89Ni11 ferromagnetic interlayer and an AlOx tunnel barrier layer for use in large-scale superconducting integrated circuits. The junctions had a small critical current (I-c) spread, where the standard deviation 1 sigma was less than 2% at 4.2K for junctions with the same designed size. It was observed that the electrical behavior of the junctions could be controlled by manipulating the film thickness of the PdNi interlayer. The junctions behaved as a pi-JJ for thicknesses of 9 and 11 nm, showing 1 sigma in the I-c spread of 1.2% for 9 nm. (C) 2017 The Japan Society of Applied Physics.