Data analysis of X-ray fluorescence holography by subtracting normal component from inverse hologram
Data analysis of X-ray fluorescence holography by subtracting normal component from inverse hologram
复制标题
逆全息图减去正态分量的X射线荧光全息数据分析
DOI:
10.1143/jjap.49.116601
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发表时间:
2010
期刊:
影响因子:
--
通讯作者:
K. Hayashi and S. Hosokawa
中科院分区:
文献类型:
--
作者:
N. Happo;K. Hayashi and S. Hosokawa
X-ray fluorescence holography (XFH) is a powerful technique for determining three-dimensional local atomic arrangements around a specific fluorescing element. However, the raw experimental hologram is predominantly a mixed hologram, ie, a mixture of hologram generated in both normal and inverse modes, which produces unreliable atomic images. In this paper, we propose a practical subtraction method of the normal component from the inverse XFH data by a Fourier transform for the calculated hologram of a model ZnTe cluster. Many spots originating from the normal components could be properly removed using a mask function, and clear atomic images were reconstructed at adequate positions of the model cluster. This method was successtully applied to the analysis of experimental ZnTe single crystal XFH data.