Data analysis of X-ray fluorescence holography by subtracting normal component from inverse hologram

Data analysis of X-ray fluorescence holography by subtracting normal component from inverse hologram
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逆全息图减去正态分量的X射线荧光全息数据分析

DOI:
10.1143/jjap.49.116601
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发表时间:
2010
期刊:
Jpn. J. Appl. Phys
影响因子:
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通讯作者:
K. Hayashi and S. Hosokawa
K. Hayashi and S. Hosokawa
中科院分区:
--
文献类型:
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作者:
N. Happo;K. Hayashi and S. Hosokawa

文献摘要

相似文献

X射线荧光全息术(XFH)是一种强大的技术,用于确定特定荧光元素周围的三维局部原子排列。然而,原始的实验全息图主要是一个混合的全息图,即,在正常和反向模式,产生不可靠的原子图像产生的全息图的混合物。本文提出了一种实用的从反XFH数据中减去法向分量的方法,并对一个ZnTe团簇的计算全息图进行了傅里叶变换。利用掩模函数可以适当地去除许多源于正常成分的斑点,并在模型团簇的适当位置重建清晰的原子图像。该方法已成功地应用于ZnTe单晶XFH实验数据的分析。
X-ray fluorescence holography (XFH) is a powerful technique for determining three-dimensional local atomic arrangements around a specific fluorescing element. However, the raw experimental hologram is predominantly a mixed hologram, ie, a mixture of hologram generated in both normal and inverse modes, which produces unreliable atomic images. In this paper, we propose a practical subtraction method of the normal component from the inverse XFH data by a Fourier transform for the calculated hologram of a model ZnTe cluster. Many spots originating from the normal components could be properly removed using a mask function, and clear atomic images were reconstructed at adequate positions of the model cluster. This method was successtully applied to the analysis of experimental ZnTe single crystal XFH data.