Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moiré method
Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moiré method
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DOI：
10.1039/d1cp05891f
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发表时间：
2022
期刊：
影响因子：
--
通讯作者：
Zhanwei Liu
中科院分区：
文献类型：
--
作者：
Yao Zhao;Yang Yang;Huihui Wen;Chao Liu;Xianfu Huang;Zhanwei Liu
A secondary moiré is developed to solve the measurement error caused by too dense moiré when evaluating atomic lattice quality.
