Reliability Analysis of Large Software Systems: Defect Data Modeling

Reliability Analysis of Large Software Systems: Defect Data Modeling
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DOI:
10.1109/32.44378
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发表时间:
1990-02
期刊:
IEEE Trans. Software Eng.
影响因子:
--
通讯作者:
Y. Levendel
Y. Levendel
中科院分区:
其他
文献类型:
--
作者:
Y. Levendel

文献摘要

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作者分析和建模的软件开发过程,并提出了大型分布式系统的现场经验。去除缺陷被证明是在现场系统部署之前实现适当质量水平的瓶颈。缺陷检测时间、缺陷修复时间和反映由于不完美的缺陷修复而引入新缺陷的因子是控制缺陷去除的规律中的一些常数。测试覆盖率是缺陷移除有效性的度量。基于这些常数的生灭数学模型的开发和现场故障报告数据建模。出生-死亡模型与更经典的指数递减模型进行了对比。这两种模型都表明,去除缺陷并不是实现质量的成本效益高的方法。由于系统中软件缺陷的长延迟,建议缺陷预防是比缺陷消除更实用的质量解决方案。>
The author analyzes and models the software development process, and presents field experience for large distributed systems. Defect removal is shown to be the bottleneck in achieving the appropriate quality level before system deployment in the field. The time to defect detection, the defect repair time and a factor reflecting the introduction of new defects due to imperfect defect repair are some of the constants in the laws governing defect removal. Test coverage is a measure of defect removal effectiveness. A birth-death mathematical model based on these constants is developed and used to model field failure report data. The birth-death model is contrasted with a more classical decreasing exponential model. Both models indicate that defect removal is not a cost-effective way to achieve quality. As a result of the long latency of software defects in a system, defect prevention is suggested to be a far more practical solution to quality than defect removal. >