Note: An online testing method for lifetime projection of high power light-emitting diode under accelerated reliability test
Note: An online testing method for lifetime projection of high power light-emitting diode under accelerated reliability test
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DOI：
10.1063/1.4896352
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发表时间：
2014-09-01
影响因子：
1.6
通讯作者：
Luo, Xiaobing
中科院分区：
文献类型：
--
作者：
Chen, Qi;Chen, Quan;Luo, Xiaobing
近年来，由于大功率发光二极管（LED）的快速发展，其寿命预测和评估已成为一个至关重要的问题。虽然现场测试在激光二极管可靠性测试中得到了广泛的应用，但在LED领域的应用并不普遍。提出了一种基于加速可靠性试验的LED寿命预测在线测试方法，并建立了原型系统。收集光学参数数据。系统误差在0.2%以内，测量不确定度在2%以内。通过这种在线测试方法，可以连续获取实验数据并收集足够的数据量。因此，可以提高投影拟合精度（r（2）= 0.954）并且可以缩短测试持续时间。(C)2014 AIP Publishing LLC.
In recent years, due to the fast development of high power light-emitting diode (LED), its lifetime prediction and assessment have become a crucial issue. Although the in situ measurement has been widely used for reliability testing in laser diode community, it has not been applied commonly in LED community. In this paper, an online testing method for LED life projection under accelerated reliability test was proposed and the prototype was built. The optical parametric data were collected. The systematic error and the measuring uncertainty were calculated to be within 0.2% and within 2%, respectively. With this online testing method, experimental data can be acquired continuously and sufficient amount of data can be gathered. Thus, the projection fitting accuracy can be improved (r(2) = 0.954) and testing duration can be shortened. (C) 2014 AIP Publishing LLC.