Improvements in AFM imaging of the spatial variation of force-distance curves: On-line images
Improvements in AFM imaging of the spatial variation of force-distance curves: On-line images
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DOI：
10.1088/0957-4484/8/2/006
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发表时间：
1997-06-01
期刊：
影响因子：
3.5
通讯作者：
Ascoli, C
中科院分区：
文献类型：
--
作者：
Cappella, B;Baschieri, P;Ascoli, C
提出了一种新的扫描方法，“触摸和升降”，旨在提高同时获取的地形和力-距离曲线的扫描表面上的每一点，提出。这种方法不会损坏样品或悬臂梁，使我们能够在相对较短的时间内收集大量数据。其最重要的特点是数据直接组织在“力切片”中，即图像提供关于样品物理化学结构的即时定性信息。我们提出并讨论了这样的图像为两个样品：在空气中的硅上的荧光素异硫氰酸酯光栅和在水中的硅上的过氧化物酶光栅，测量在这两种情况下的刚度，吸引力和粘附力的空间变化。
A new scanning method, 'touch and lift', aimed to improve the simultaneous acquisition of topography and force-distance curves on each point of the scanned surface, is presented. This method does not damage the sample or the cantilever and enables us to collect a lot of data in a relatively short time. Its most important feature is that data are directly organized in 'force-slices', i.e. images giving immediate qualitative information on the physico-chemical structure of the sample. We present and discuss such images for two samples: a fluorescein isothyocyanate grating on silicon in air and a peroxidase grating on silicon in water, measuring the spatial variation of stiffness, attractive forces and adhesion in both cases.