Preparation of calibrating standards for x-ray fluorescence spectrometry of trace metals in plastics
Preparation of calibrating standards for x-ray fluorescence spectrometry of trace metals in plastics
复制标题
塑料中痕量金属 X 射线荧光光谱测定校准标准品的制备
DOI：
10.1002/xrs.675
复制
发表时间：
2003
影响因子：
1.2
通讯作者：
Toshihiro Nakamura
中科院分区：
文献类型：
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作者：
K. Nakano;Toshihiro Nakamura
本文提出了一种简便的X射线荧光光谱法测定塑料中V、Cr、Co、Ni、Ge、Sb的方法。校准标准通过浇注聚氨酯或聚酯制备，包括有机金属化合物的二甲苯溶液作为标准。校准盘具有均匀的元素分布和优异的耐久性。方法的检出限（3σ）分别为：V 0.19 mass ppm，Cr 0.42 mass ppm，Co 0.24 mass ppm，Ni 0.18 mass ppm，Ge 0.066 mass ppm，Cr 200 mass ppm，Sb 400 mass ppm。和2.1用于Sb。所提出的方法已应用于几种不同的工业塑料。定量结果与原子吸收光谱法和X射线荧光光谱法基本参数计算法所得结果一致。版权所有© 2003年约翰威利父子有限公司。
Convenient x-ray fluorescent spectrometry was developed for the determination of V, Cr, Co, Ni, Ge and Sb in plastic materials. The calibrating standards were prepared by casting of polyurethane or polyester including a xylene solution of organometallic compounds as a standard. The calibrating disk had a homogeneous elemental distribution and excellent durability. The calibration curves of six elements showed a good linearity of less than 50 mass ppm for V and Ni, 100 mass ppm for Co and Ge, 200 mass ppm for Cr, and 400 mass ppm for Sb. The lower limits of detection (3σ) of the present method were 0.19 mass ppm for V, 0.42 for Cr, 0.24 for Co, 0.18 for Ni, 0.066 for Ge, and 2.1 for Sb. The proposed method has been applied to several different industrial plastics. The quantitative results are in good agreement with those obtained by the AAS method and x-ray fluorescent spectrometry using the fundamental parameter calculation method. Copyright © 2003 John Wiley & Sons, Ltd.
Radiation-LOD：辐射监测数据的 GeoSPARQL 端点
DOI：
--
发表时间：
--
期刊：
影响因子：
--
作者：
小島功;田中良夫;中村章人;的野晃整
通讯作者：
的野晃整