Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift

Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift
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增强型 DFT 用于扫描移位期间转换故障的偶然检测

DOI:
10.1109/mdts54894.2022.9826976
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发表时间:
2022
期刊:
2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS
影响因子:
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通讯作者:
Manikas, Theodore
Manikas, Theodore
中科院分区:
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文献类型:
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作者:
Jiang, Hui;Dworak, Jennifer;Nepal, Kundan;Manikas, Theodore

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