Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction
Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction
复制标题
TOF-SIMS 和显微图像的主成分分析图像融合以及通过像素减少的低强度二次离子增强
DOI：
10.1116/1.5013218
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发表时间：
2018
影响因子：
1.4
通讯作者：
Yoshishige Kimura
中科院分区：
文献类型：
--
作者：
Kazuma Takahashi;Takayuki Yamagishi;Satoka Aoyag;Dan Aoki;Kazuhiko Fukushima;Yoshishige Kimura
