User-friendly Oblique Plane Microscopy on a fully functional commercially available microscope base
User-friendly Oblique Plane Microscopy on a fully functional commercially available microscope base
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用户友好的斜平面显微镜，位于功能齐全的商用显微镜底座上
DOI：
10.1101/2024.01.09.574832
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发表时间：
2024
期刊：
影响因子：
--
通讯作者：
Sirinakis G
中科院分区：
文献类型：
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作者：
Sirinakis G
在这项工作中，我们提出了一个斜平面显微镜设计的无缝工作与市售的显微镜基地。为了支持所有的功能提供的显微镜基地，其中的物镜透镜的位置是不固定的，我们采用了一个双镜扫描的几何形状，可以补偿的变化，在常规显微镜操作的物镜透镜的位置。我们发现，在100倍、1.35 NA物镜透镜离开其设计位置的± 1 mm位移范围内，PSF尺寸在横向和轴向尺寸上分别增加<3%和<11%，而在围绕焦平面延伸± 10 µm的体积内，放大率误差<0.5%。 与更传统的扫描透镜/振镜组合相比，双镜扫描几何结构提供了更高的光效率和更紧凑的占地面积，这可能有利于所有OPM设计，无论是否使用商业基础。
In this work we present an oblique plane microscope designed to work seamlessly with a commercially available microscope base. To support all the functionality offered by the microscope base, where the position of the objective lens is not fixed, we adopted a two-mirror scanning geometry that can compensate for changes to the position of the objective lens during routine microscope operation. We showed that within a ± 1 mm displacement range of the 100X, 1.35 NA objective lens away from its designed position, the PSF size increased by <3% and <11% in the lateral and axial dimensions, respectively, while the error in magnification was <0.5% within volumes extending ± 10 µm about the focal plane. Compared to the more traditional scan-lens/galvo-mirror combination, the two-mirror scanning geometry offers higher light efficiency and a more compact footprint, which could be beneficial to all OPM designs regardless of the use of a commercial base or not.