Transient simulation of arbitrary nonuniform interconnection structures characterized by scattering parameters
Transient simulation of arbitrary nonuniform interconnection structures characterized by scattering parameters
复制标题
以散射参数为特征的任意非均匀互连结构的瞬态仿真
DOI：
10.1109/81.199890
复制
发表时间：
1992
影响因子：
0.4
通讯作者：
D. Zutter
中科院分区：
文献类型：
--
作者：
T. Dhaene;L. Martens;D. Zutter
本文提出了一种非迭代时变电路模型，用于分析一般均匀和非均匀互连结构在任意线性或非线性负载下的瞬态响应。使用模拟或测量的散射参数数据来表征互连结构。不需要近似或模型拟合。在每个时间点，所有的互连结构的耦合端口被建模为扩展戴维南等效，其中包括恒定的电阻和时间相关的电压源。这种新的通用电路表示与SPICE等现有仿真程序兼容。电路的线性和非线性负载的仿真说明了这种方法。>
A noniterative time-dependent circuit model is presented for transient analysis of general uniform and nonuniform interconnection structures terminated with arbitrary, linear or nonlinear loads. Simulated or measured scattering parameter data are used to characterize the interconnection structures. No approximations or model fitting are required. At each point in time, all coupled ports of the interconnection structure are modeled as extended Thevenin equivalents, which consist of constant resistances and time-dependent voltage sources. This new general circuit representation is compatible with existing simulation programs such as SPICE. Simulations on circuits with linear and nonlinear loads illustrate the approach. >
影响因子：
20.6
作者：
HARRIS, FJ
通讯作者：
HARRIS, FJ