Extremely low‐noise potentiometry with a scanning tunneling microscope
Extremely low‐noise potentiometry with a scanning tunneling microscope
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使用扫描隧道显微镜进行极低噪声电位测量
DOI：
10.1063/1.1140428
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发表时间：
1989
影响因子：
1.6
通讯作者：
R. Koch
中科院分区：
文献类型：
--
作者：
J. Pelz;R. Koch
新的交流偏压和检测技术已经被开发出来，使扫描隧道显微镜（STM）能够以亚μV的灵敏度测量金属表面上电势的空间变化。当使用具有最小电屏蔽且无振动隔离的室温STM运行时，电压灵敏度受到隧道电阻的热（约翰逊）噪声的限制。
Novel ac biasing and detection techniques have been developed to allow a scanning tunneling microscope (STM) to measure spatial variations in electric potential on metallic surfaces with sub‐μV sensitivity. When implemented with a room‐temperature STM operating with minimal electrical shielding and no vibration isolation, the voltage sensitivity was limited by the thermal (Johnson) noise of the tunneling resistance.