Influence of surface preparation on CdZnTe nuclear radiation detectors
Influence of surface preparation on CdZnTe nuclear radiation detectors
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DOI:
10.1016/j.apsusc.2011.05.098
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发表时间:
2011-08
影响因子:
6.7
通讯作者:
Q. Zheng;F. Dierre;J. Crocco;V. Carcelén;H. Bensalah;J. Plaza;E. Dieguez
中科院分区:
文献类型:
--
作者:
Q. Zheng;F. Dierre;J. Crocco;V. Carcelén;H. Bensalah;J. Plaza;E. Dieguez
High resolution X-ray diffraction (HRXRD), Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM) techniques were used to characterize the surface of CdZnTe (CZT) samples treated by mechanical lapping, polishing and chemical etching processes. The results confirm that the etching process produces the highest intensity diffraction peak, and the best full-width-at-half-maximum (FWHM). Fourier Transform Infrared (FTIR) spectroscopy shows that fine polishing increases the infrared transmission of the CZT sample, while etching with 2% bromine methanol (BM) etching decreases the infrared transmission. Different etchants and concentrations were investigated by comparing the surface morphology and roughness. The bromine methanol etching has shown more flat surface with lower roughness than the other etchants.