Mid-to-high- Z precision x-ray measurements
Mid-to-high- Z precision x-ray measurements
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DOI:
10.1103/physreva.26.2696
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发表时间:
1982-11
影响因子:
2.9
通讯作者:
E. Kessler;R. Deslattes;D. Girard;W. Schwitz;L. Jacobs;O. Renner
中科院分区:
文献类型:
--
作者:
E. Kessler;R. Deslattes;D. Girard;W. Schwitz;L. Jacobs;O. Renner
New x-ray wavelength (energy) and width measurements are reported for a number of elements from $47\ensuremath{\le}Z\ensuremath{\le}92$. The x rays were produced with the use of an electron Van de Graaff, and the measurements were made with a two-axis flat-crystal transmission spectrometer equipped with angle-measuring interferometers. The new measurements reported here, combined with other high-precision x-ray wavelengths, form a moderately extensive data base for comparison with theoretical calculations. Comparison with recent revisions of a previously available all-$Z$ calculation reveals improved patterns of general agreement with, however, important exceptions. The newly measured linewidths are in agreement with widths calculated via relativistic wave functions used for the term estimates.