TOF-SIMS characterization and imaging of controlled-release drug delivery systems
TOF-SIMS characterization and imaging of controlled-release drug delivery systems
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DOI：
10.1021/ac000450
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发表时间：
2000-11-15
影响因子：
7.4
通讯作者：
Patel, N
中科院分区：
文献类型：
--
作者：
Belu, AM;Davies, MC;Patel, N
采用夜间二次离子质谱法（TOF-SIMS）对作为控释药物递送系统的多层药珠进行分析。TOF-SIMS分析了每个微球系统的横截面，可以同时从所有层中获得分子化学信息，在原位，通过对药物，赋形剂和涂层材料的特定离子种类的成像来评估每个层的完整性。在这项研究中，三颗珠子的成分分布各不相同。每种药物（茶碱、扑热息痛、强的松龙）的母体分子离子的图像显示，它们的分布范围从微米大小的颗粒在一个颗粒截面上到几乎均匀的颗粒在另一个颗粒截面上。通过质谱法评估了珠子中每一层的化学成分；成分并不总是符合制造商的规格。此外，许多常见的药物头部成分作为纯物质进行了分析，首次提供了这些物质的TOF-SIMS参考光谱。
Time-of night secondary ion mass spectrometry (TOF-SIMS) was used for the analysis of multilayer drug beads that serve as controlled-release drug delivery systems. TOF-SIMS analysis of a cross section of each bead system allowed molecular chemical information to be gained from all of the layers simultaneously, in situ, The integrity of each of the layers was evaluated through imaging of specific ion species for the drug, excipient, and coating materials. The three beads in this study each showed a unique distribution of ingredients. Images of the parent molecular ion for each drug (theophylline, paracetamol, prednisolone) showed their distribution ranged from micrometer-sized particles in one bead cross section to almost homogeneous in another bead cross section. The chemical composition of each of the layers in the beads was evaluated through mass spectrometry; the ingredients did not always match the manufacturer's specification. In addition, many common drug head ingredients were analyzed as pure substances, providing TOF-SIMS reference spectra of these materials for the first time.