Retro‐fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation
Retro‐fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation
复制标题
使用两个 Cs 像差校正器改造旧式 (S)TEM，以实现 80 kV 和 60 kV 操作
作者：
F. Börrnert;A. Bachmatiuk;S. Gorantla;D. Wolf;A. Lubk;B. Büchner;M. Rümmeli
对于使用透射电子显微镜表征轻材料，80 kV 甚至 60 kV 的低电子加速电压很有吸引力，因为可以减少电子束对样品的损伤。使用球面像差 (Cs) 校正器可以恢复随之而来的显微镜分辨率降低的问题，而球面像差 (Cs) 校正器大多数情况下仅适用于最新和最昂贵的显微镜。在这里，我们表明，现有 TEM 的升级是一种有吸引力且具有成本效益的替代方案。我们报告了 20 世纪 90 年代初制造的 JEOL JEM-2010F 石墨材料的低电压性能，并改装了传统成像 Cs 校正器和探针 Cs 校正器。性能数据显示，Cs 改装仪器在传统成像 (TEM) 和扫描 (STEM) 模式下都可以与更现代的最先进仪器竞争。
For the characterization of light materials using transmission electron microscopy, a low electron acceleration voltage of 80 kV or even 60 kV is attractive due to reduced beam damage to the specimen. The concomitant reduction in resolving power of the microscope can be restored when using spherical aberration (Cs) correctors, which for the most part are only available in the latest and most expensive microscopes. Here, we show that upgrading of existing TEMs is an attractive and cost‐effective alternative. We report on the low‐voltage performance on graphitic material of a JEOL JEM‐2010F built in the early 1990s and retro‐fitted with a conventional imaging Cs corrector and a probe Cs corrector. The performance data show Cs retro‐fitted instruments can compete very favourably against more modern state‐of‐the‐art instruments in both conventional imaging (TEM) and scanning (STEM) modes.
影响因子：
2.2
作者：
Kaiser, U.;Biskupek, J.;Benner, G.
通讯作者：
Benner, G.