Preliminary test of topmetal-II- sensor for X-ray polarization measurements
Preliminary test of topmetal-II- sensor for X-ray polarization measurements
复制标题
X射线偏振测量topmetal-II[式略]传感器的初步测试
DOI：
10.1016/j.nima.2021.165430
复制
发表时间：
2021
影响因子：
1.4
通讯作者：
Xiangming Sun
中科院分区：
文献类型：
--
作者：
Zili Li;Huanbo Feng;Xuefeng Huang;Jin Zhang;Jiaqi Su;Xinchen Cai;Zuke Feng;Qian Liu;Hongbang Liu;Chaosong Gao;Le Xiao;Xiangming Sun
我们提出了一个原型探测器的组装和初步结果，该探测器是为了评估Topmetal-II−在软X射线偏振计（SXP）中的应用性能而开发的。SXP用于测量随机发生的伽马射线暴（GRB）和其他特定致密天体发射的X射线的偏振。Topmetal-II−是一种硅像素传感器，旨在直接跟踪带电粒子。该测试在0.8 atm压力下对Ne和DME的气体混合物进行，并使用Topmetal-II−传感器对光电子轨迹进行成像。本文给出了在四种情况下获得的典型真实的X射线径迹。从100%极化4.5 keV X射线的轨迹中推导出的调制因子在信号效率为0.53%时达到0.29%，对于非极化5.9 keV X射线，剩余调制为0.2%量级。
We present the assembly and preliminary results of a prototype detector, which was developed to evaluate the performance of the Topmetal-II− for application in Soft X-ray Polarimeter (SXP). SXP is used to measure the polarization of X-rays emitted from randomly occurring gamma-ray bursts (GRBs) and other specific dense celestial bodies. The Topmetal-II− is a silicon pixel sensor designed to directly track charged particles. The test was conducted on a gas mixture of Ne and DME at 0.8 atm pressure, and the Topmetal-II− sensor was used to image the photoelectron tracks. Typical real X-ray tracks obtained under four conditions are presented in this paper. The modulation factor derived from the tracks of 100% polarized 4.5 keV X-rays reached∼ 29% at∼ 53% signal efficiency, with a residual modulation of the order of∼ 2% for unpolarized 5.9 keV X-rays.