Role of adhesion in shear strength of nanowire-substrate interfaces
Role of adhesion in shear strength of nanowire-substrate interfaces
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DOI：
10.1088/0022-3727/42/9/095304
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发表时间：
2009-05-07
影响因子：
3.4
通讯作者：
Haque, M. A.
中科院分区：
文献类型：
--
作者：
Manoharan, M. P.;Haque, M. A.
陶瓷-衬底接触的剪切强度严重影响基于陶瓷的传感器、致动器和纳米电子器件的电和机械接触特性。然而，由于与这些一维纳米结构相关的实验挑战，文献中很少有研究，并且现有的接触力学模型都不能解释其超高的弯曲柔度。使用一种新的实验装置，有效地抑制粘附力和摩擦力，我们表明，氧化锌纳米线和硅系统的摩擦系数可以是约两个数量级高于散装值，即使在零外部施加正常负载。我们的模型纳米线弯曲的遵守和毛细管线张力竞争机制来解释所观察到的异常粘附摩擦耦合，并建立一个标准的接触面积依赖于在一维界面的摩擦。
The shear strength of nanowire-substrate contact critically influences the electrical and mechanical contact characteristics of nanowire-based sensors, actuators and nanoelectronic devices. Yet, very few studies are available in the literature because of the experimental challenges associated with these one-dimensional nanostructures and none of the existing contact mechanics models account for their ultra-high bending compliance. Using a novel experimental setup that effectively decouples adhesion and friction forces, we show that the friction coefficient for the zinc oxide nanowires and silicon system can be about two orders of magnitude higher than the bulk values, even under zero externally applied normal loads. We model nanowire bending compliance and capillary line tension as competing mechanisms to explain the observed anomalous adhesion-friction coupling and establish a criterion for contact area dependence in friction in one-dimensional interfaces.