STRUCTURE-ANALYSIS OF SI(111)-7X7 RECONSTRUCTED SURFACE BY TRANSMISSION ELECTRON-DIFFRACTION
STRUCTURE-ANALYSIS OF SI(111)-7X7 RECONSTRUCTED SURFACE BY TRANSMISSION ELECTRON-DIFFRACTION
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DOI:
10.1016/0039-6028(85)90753-8
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发表时间:
1985-12-01
期刊:
影响因子:
1.9
通讯作者:
TAKAHASHI, M
中科院分区:
文献类型:
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作者:
TAKAYANAGI, K;TANISHIRO, Y;TAKAHASHI, M