Fundamentals of Automated EBSD
Fundamentals of Automated EBSD
复制标题
自动化 EBSD 基础知识
DOI：
10.1007/978-1-4757-3205-4_5
复制
发表时间：
2000
期刊：
影响因子：
--
通讯作者：
S. Wright
中科院分区：
文献类型：
--
作者：
S. Wright
本章的重点是电子背散射衍射（EBSD）模式晶体取向的自动测定。早期的系统需要精通晶体学的操作人员手动识别捕获模式中的特征，以确定相应的方向。然后，计算机将根据人工提供的数据确定方向。现代自动化系统使用图像处理技术来识别从衍射模式确定晶体取向所需的特征，而无需任何操作人员的干预。本章描述了实现自动化EBSD的不同过程。将简要描述用于增强衍射图案的图像处理技术；手工区域轴标引技术将作历史介绍；描述了以霍夫变换为焦点的衍射带的检测过程；将详细介绍利用衍射带确定取向的方法；将讨论有关自动索引不确定性的问题；本文将描述计算机索引模式所需的相关结构数据，最后将描述校准系统的方法。虽然本章将简要介绍替代方法，并在适用的情况下提供一些参考资料，但重点将放在作者最熟悉的那些技术上。
This chapter focuses on the automated determination of crystallographic orientation from electron backscatter diffraction (EBSD) patterns. Early systems required an operator skilled in crystallography to manually identify features in a captured pattern in order to determine the corresponding orientation. The computer would then determine the orientation from the manually supplied data. Modern automated systems use image-processing techniques to identify the features needed to determine the crystallographic orientation from diffraction patterns without any operator intervention. This chapter describes the different procedures used in achieving automated EBSD. Image processing techniques used to enhance the diffraction patterns will be briefly described; the manual zone axis indexing technique will be discussed for historical introduction; a description of the procedure for detecting the diffraction bands with a focus on the Hough transform will be given; methods for determining orientation using diffraction bands will be detailed; issues concerning automated indexing uncertainties will be discussed; a description of the relevant structural data needed by the computer to index the patterns will be given and finally methods for calibrating a system will described. Whereas this chapter will briefly introduce alternative approaches and give some reference material where applicable, the focus will be on those techniques most familiar to the author.