White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window.
White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window.
复制标题
使用来自 CVD 金刚石真空窗口的 X 射线背向散射进行白光束诊断。
DOI：
10.1107/s1600577519015340
复制
发表时间：
2020
影响因子：
2.5
通讯作者：
Van Silfhout R
中科院分区：
文献类型：
--
作者：
Van Silfhout R
利用针孔X射线照相机收集真空窗口的后向散射X射线，提供了一种有效可靠的测量同步辐射白色光束束形和位置的方法。在本文中，测量是在ESRF光束线ID6使用真空低温冷却的永磁波荡器（CPMU 18）和传统的U32波荡器作为其辐射源，允许测试在非常高的功率密度水平进行调整，通过改变差距的波荡器。这些测量结果表明，可以使用简单的几何结构记录光束形状和光束位置，而无需在光束路径中放置任何其他物品。通过这种简单的测试设置，可以记录均方根噪声系数为150 nm的光束位置。
Collecting back-scattered X-rays from vacuum windows using a pinhole X-ray camera provides an efficient and reliable method of measuring the beam shape and position of the white synchrotron beam. In this paper, measurements are presented that were conducted at ESRF beamline ID6 which uses an in-vacuum cryogenically cooled permanent-magnet undulator (CPMU18) and a traditional U32 undulator as its radiation sources, allowing tests to be performed at very high power density levels that were adjusted by changing the gap of the undulators. These measurements show that it is possible to record beam shape and beam position using a simple geometry without having to place any further items in the beam path. With this simple test setup it was possible to record the beam position with a root-mean-square noise figure of 150 nm.