Visualization of a Pseudospark-Sourced Electron Beam
Visualization of a Pseudospark-Sourced Electron Beam
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DOI：
10.1109/tps.2014.2300691
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发表时间：
2014-10
影响因子：
1.5
通讯作者：
D. Bowes;H. Yin;Wenlong He;K. Ronald;A. Phelps;Defeng Chen;Peng Zhang;Xiao-dong Chen;Daohui Li;A. Cross
中科院分区：
文献类型：
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作者：
D. Bowes;H. Yin;Wenlong He;K. Ronald;A. Phelps;Defeng Chen;Peng Zhang;Xiao-dong Chen;Daohui Li;A. Cross
对直径为3mm的赝火花源电子束进行了实验研究。在PS放电期间检测X射线的发射，并且使用PS源电子束在46 kV的施加电压下撞击在0.1 mm厚的钼靶上形成清晰的X射线图像。使用荧光涂层闪烁体，束的横截面轮廓和周围的离子通道也进行了观察。这些结果证实了电子束的存在。
A pseudospark (PS)-sourced electron beam of 3-mm diameter has been experimentally investigated. Emission of X-rays was detected during a PS discharge and clear X-ray images were formed using the PS-sourced electron beam impacting on a 0.1-mm-thick molybdenum target at an applied voltage of 46 kV. Using a phosphor-coated scintillator, the beam's cross-sectional profile and surrounding ion channel were also observed. These results confirm the presence of an electron beam.