DEPFET pixels as a vertex detector for the Belle II experiment
DEPFET pixels as a vertex detector for the Belle II experiment
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DEPFET 像素作为 Belle II 实验的顶点检测器
DOI：
10.1016/j.nima.2013.05.054
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发表时间：
2013
影响因子：
1.4
通讯作者：
J. Schieck
中科院分区：
文献类型：
--
作者：
J. Schieck
目前，位于日本筑波的KEK加速器中心的重口味工厂KEKB正在升级为超级KEKB工厂，目标是将光度大幅提高至8×10 35厘米−2 S−1。这将亮度提高40倍，这需要对Belle探测器进行重大改进。顶点探测器需要重新设计，除了四层硅条探测器外，还将在距离交互作用点最近的地方安装基于DEPFET技术的像素探测器。本文将介绍对这种像素探测器的要求、DEPFET技术以及像素探测器的现状。
Currently the heavy flavour factory KEKB located at the KEK accelerator centre in Tsukuba, Japan, is being upgraded to the Super KEKB factory, aiming for a substantially higher luminosity of 8× 10 35 cm− 2 s− 1. This by a factor of 40 increased luminosity that requires significant modifications of the Belle detector. The vertex detector needs to be redesigned and, besides a four-layer silicon strip detector, a pixel detector based on the DEPFET technology will be installed closest to the interaction point. The requirements for this pixel detector, the DEPFET technology and the current status of the pixel detector will be presented in this paper.