Virtual reality generation of synthetic images of SMDS for automatic optical inspection algorithms
Virtual reality generation of synthetic images of SMDS for automatic optical inspection algorithms
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用于自动光学检测算法的 SMDS 合成图像的虚拟现实生成
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
A. Gallegos
中科院分区：
文献类型：
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作者：
F. Ruiz;A. Gallegos
本文介绍了一种用于印制电路板、印刷电路板表面贴装器件(SMD)自动光学检测系统中产生参考图案的合成图像生成方法。这些图像是在已知照明源下对SMD的虚拟现实模型应用基本反射定律来数值模拟正视图而创建的。在分类方法中，对合成图像进行处理并将其用作参考模式，以确定被检查设备的状态，从而避免使用参考样本来训练系统。我们描述了这项工作中使用的视觉系统的主要特征，并介绍了我们开发的创建和表征黑白图像的方法。接下来，我们介绍了用来生成数值2D黑白图像的方法，该图像再现了由共面照明系统在SMD表面上产生的正面图上的光强分布，并说明了如何将合成图像用于描述实现的贝叶斯分类器的分类方法，所述贝叶斯分类器被实现来确定被检查的SMD的状态。最后，我们讨论了利用合成图像来创新检测系统分类方法的可能性。
In this paper we introduce a generation method of synthetic images designed to produce reference patterns in an Automatic Optical Inspection System of Surface Mounted Devices, SMD, on Printed Circuit Boards, PCB. The images are created numerically emulating a frontal view applying basic reflection laws to a Virtual Reality model of the SMD under known illumination sources. The synthetic images are processed and used as reference patterns in the classification method to determine the state of an inspected device, thus avoiding the use of reference samples to train the system. We describe the main features of the Visual System used in this work and we introduce the method we developed to create and characterize b/w images. Next, we introduce the method created to generate numerically 2D b/w images reproducing the distribution of light intensity produced by the coplanar illumination system on the surfaces of the SMD in a frontal view, and, we illustrate how the synthetic images can be used in classification methods describing a Bayes Classifier implemented to determine the state ¿present/absent¿ of an inspected SMD. Finally, we discuss about the possibilities of using synthetic images to innovate the classification methods on inspection systems.