Optimizing the GaAs capping layer growth of 1.3 mu m InAs/GaAs quantum dots by a combined two-temperature and annealing process at low temperatures

Optimizing the GaAs capping layer growth of 1.3 mu m InAs/GaAs quantum dots by a combined two-temperature and annealing process at low temperatures
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通过两温结合低温退火工艺优化 1.3 μm InAs/GaAs 量子点的 GaAs 盖层生长

DOI:
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发表时间:
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影响因子:
1.8
通讯作者:
Masao Nishioka
Masao Nishioka
中科院分区:
材料科学3区
文献类型:
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作者:
Tao Yang;Yasuhiko Arakawa;Masao Nishioka

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