Distance displacement measurement with two-photon absorptionprocess in Si-APD and high-speed opticalmillimeter wave scanner
Distance displacement measurement with two-photon absorptionprocess in Si-APD and high-speed opticalmillimeter wave scanner
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Si-APD 和高速光学毫米波扫描仪中双光子吸收过程的距离位移测量
DOI：
10.1117/12.885969
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
T.Kurokawa
中科院分区：
文献类型：
--
作者：
Y. Tanaka;D. Meguro;N. Endo;T.Kurokawa
开发了一种高速光学毫米波扫描仪，并将其引入基于 Si-APD 中双光子吸收（TPA）过程的距离位移测量中。基于TPA的距离位移测量原则上可以测量10毫米到10公里外物体的位移。上次研究中已经利用调制频率范围为10 GHz的强度调制光实现了10 m至10 km的长距离测量。本研究中开发的高速光学毫米波扫描仪以最高速度在 10 毫秒内扫描了 100 GHz 以上。我们成功测量了10毫米的短距离，数据采集时间为1秒，精度为6.34×10-3。
A high-speed optical millimeter wave scanner has been developed and introduced into the distance displacement measurement based on two-photon absorption (TPA) process in a Si-APD. The TPA-based distance displacement measurement can measure the displacement of an object at 10 mm to 10 km away in principle. The measurement for the long distance of 10 m to 10 km was already realized by using intensity modulated light with a modulation frequency range of 10 GHz in the last study. The high-speed optical millimeter wave scanner developed in this study scanned over 100 GHz in 10 ms at its highest speed. We have successfully measured the short distance of 10 mm with a data acquisition time of 1 s and an accuracy of 6.34×10-3.