DIAGNOSTIC TOOLS FOR ULTRA-LOW EMITTANCE AND ULTRA-SHORT ELECTRON BUNCHES
DIAGNOSTIC TOOLS FOR ULTRA-LOW EMITTANCE AND ULTRA-SHORT ELECTRON BUNCHES
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作者:
H. Schlarb
The operation of future linear colliders and X-ray Free Electron Lasers places stringent demands on the required beam quality. Setting up and optimization of the machine requires reliable and effective beam diagnostics tools. Different measurement methods and reconstruction techniques for both the transverse and longitudinal phase space distributions are discussed.