Ultrashort pulse reflectometry for density profile and fluctuation measurements on SSPX
Ultrashort pulse reflectometry for density profile and fluctuation measurements on SSPX
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用于 SSPX 上密度剖面和波动测量的超短脉冲反射仪
DOI：
10.1063/1.1527254
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发表时间：
2000
影响因子：
1.6
通讯作者：
N. Luhmann
中科院分区：
文献类型：
--
作者：
Y. Roh;C. Domier;N. Luhmann
一个宽带，多通道超短脉冲反射（USPR）诊断的持续Spheromak物理实验设备最近经历了一些系统升级，这导致了显着改善的信号噪声比的USPR信号和显着减少的“丢失信号”的数量，其中的反射波形的幅度下降到检测阈值以下。这极大地增强了USPR研究相对快速的密度分布变化的能力，并允许以短至3 μs的脉冲重复率同时监测多个密度层。本文提供了升级后的USPR系统的详细信息，以及密度分布和波动数据。
A broadband, multichannel ultrashort pulse reflectometry (USPR) diagnostic on the Sustained Spheromak Physics eXperiment device has recently undergone a number of system upgrades, which has resulted in significant improvements in the signal-to-noise ratio of the USPR signals and a dramatic reduction in the number of “lost signals” in which the amplitude of the reflected wave form drops below detection threshold. This has greatly enhanced the ability of USPR to study relatively fast density profile modifications, and allows the simultaneous monitoring of multiple density layers with as short as a 3 μs pulse repetition rate. This article provides details of the upgraded USPR system together with density profiles and fluctuation data.