High throughput surface characterisation of a combinatorial material library
High throughput surface characterisation of a combinatorial material library
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DOI：
10.1002/adma.200700949
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发表时间：
2007-09-17
影响因子：
29.4
通讯作者：
Davies, Martyn C.
中科院分区：
文献类型：
--
作者：
Urquhart, Andrew J.;Anderson, Daniel G.;Davies, Martyn C.
该图示出了表示可以从微阵列库内的每个聚合物样品的表面获得的信息的示意图。所使用的高通量表面分析技术包括X射线光电子能谱、飞行时间二次离子质谱和水接触角测量。
The figure shows a schematic representing the information that can be obtained from the surface of each polymer sample within the microarrayed library. High throughput surface analytical techniques used include X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectrometry and water contact angle measurement.