Probing the absolute scattering intensity by means of a laboratory‐based small‐angle X‐ray scattering camera using an imaging plate detector
Probing the absolute scattering intensity by means of a laboratory‐based small‐angle X‐ray scattering camera using an imaging plate detector
复制标题
使用成像板探测器通过实验室小角度 X 射线散射相机探测绝对散射强度
DOI：
10.1107/s1600576715021469
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发表时间：
2016
影响因子：
6.1
通讯作者：
H. Nirschl
中科院分区：
文献类型：
--
作者：
A. Gutsche;N. Dingenouts;Xiaoai Guo;M. Meier;H. Nirschl
本文讨论了成像板 (IP) 探测器在小角度 X 射线散射实验中探测绝对强度的应用。 IP 探测器与内部改装的 Kratky 摄像机一起使用。结果表明，将散射数据归一化为传输的主光束强度可以正确补偿通常与 IP 检测器相关的各种不需要的特征，例如褪色效应和重复性差的扫描时间，促进精确的绝对强度校准。通过测量大量不同的硅溶胶作为二级标准来进行绝对强度校准。校准系数将测量数据转换为绝对单位，由不同硅溶胶获得的数据的平均值确定，从而提供 IP 检测器的精确校准。特别是，如果使用纯液体或标准蛋白质作为二级标准，硅溶胶不需要应用同步加速器辐射或通常需要的长时间暴露时间。为了检查 IP 检测器在实际合成中的适用性，在各种反应条件下合成了 Stober 二氧化硅颗粒，并探测了散射强度并将其转换为绝对单位。由绝对强度提供的二氧化硅颗粒的体积分数和数密度与不同反应条件下预测的理论值表现出良好的一致性。因此，IP检测器可用于精确探测绝对强度。
This paper deals with the application of an imaging plate (IP) detector for probing absolute intensities in small-angle X-ray scattering experiments. The IP detector is used with an in-house modified Kratky camera. It is shown that the normalization of scattering data to the transmitted primary beam intensity properly compensates for various unwanted features typically associated with the IP detector, e.g. the fading effect and poorly reproducible scanning times, promoting precise absolute intensity calibration. The absolute intensity calibration was performed by measuring a large number of different silica sols serving as secondary standards. The calibration factor, which converts the measured data into absolute units, was determined by the average over the data obtained for different silica sols, providing a precise calibration of the IP detector. In particular, it is shown that silica sols do not require application of synchrotron radiation or a long exposure time as typically needed if pure liquids or standard proteins are used as secondary standards. To check the applicability of the IP detector in a real synthesis, Stober silica particles were synthesized under various reaction conditions and the scattering intensity was probed and converted into absolute units. The volume fractions and the number densities of silica particles provided by the absolute intensities showed a good agreement with theoretical values predicted for the different reaction conditions. Therefore, the IP detector can be used for accurate probing of absolute intensities.
通过时间分辨超小角 X 射线散射研究具有双峰尺寸分布的带电胶体二氧化硅球悬浮液中的成核和晶体生长
DOI：
10.1063/1.4902904
发表时间：
2014
期刊：
The Journal of chemical physics
影响因子：
--
作者：
W. Hornfeck;D. Menke;M. Forthaus;S. Subatzus;M. Franke;H.-J. Schöpe;T. Palberg;J. Perlich;D. Herlach
通讯作者：
D. Herlach
SWAXS 研究放电合成的金属纳米颗粒的扩散边界纳米结构
影响因子：
2.5
作者：
Xiaoai Guo;Alexander Gutsche;Hermann Nirschl
通讯作者：
Hermann Nirschl
对 CVS 和 CVD 工艺制备的氧化物负载 Pt 纳米颗粒进行小角和广角 X 射线散射联合研究
影响因子：
5.2
作者：
Xiaoai Guo;Kun Gao;Alexander Gutsche;Martin Seipenbusch;Hermann Nirschl
通讯作者：
Hermann Nirschl